Skip to Content

scanning electron microscope

 

Definition: a microscope in which the object in a vacuum is scanned in a raster pattern by a slender electron beam, generating reflected and secondary electrons from the specimen surface that are used to modulate the image on a synchronously scanned cathode ray tube; with this method a three-dimensional image is obtained, with both high resolution and great depth of focus.

Further information

Always consult your healthcare provider to ensure the information displayed on this page applies to your personal circumstances.

© Copyright 2018 Wolters Kluwer. All Rights Reserved. Review date: Sep 19, 2016.

Hide