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scanning electron microscope

 

Definition: a microscope in which the object in a vacuum is scanned in a raster pattern by a slender electron beam, generating reflected and secondary electrons from the specimen surface that are used to modulate the image on a synchronously scanned cathode ray tube; with this method a three-dimensional image is obtained, with both high resolution and great depth of focus.

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© Copyright 2017 Wolters Kluwer. All Rights Reserved. Review Date: Sep 19, 2016.
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